Development of SOI pixel process technology

نویسندگان

  • Y. Arai
  • T. Miyoshi
  • T. Tsuboyama
  • S. Terada
  • Y. Ikegami
  • R. Ichimiya
  • T. Kohriki
  • K. Tauchi
  • T. Uchida
  • K. Hara
  • H. Miyake
  • M. Kochiyama
  • K. Hanagaki
  • M. Hirose
  • J. Uchida
  • Y. Horii
  • H. Yamamoto
  • T. Tsuru
  • R. Takashima
  • H. Ikeda
  • D. Kobayashi
  • H. Nagata
  • A. Taketani
  • T. Kameshima
  • M. Yabashi
  • P. Denes
  • P. Giubilato
  • K. Fukuda
  • I. Kurachi
  • N. Kuriyama
  • M. Motoyoshi
چکیده

A silicon-on-insulator (SOI) process for pixelated radiation detectors is developed. It is based on a 0.2 mm CMOS fully depleted (FD-)SOI technology. The SOI wafer is composed of a thick, high-resistivity substrate for the sensing part and a thin Si layer for CMOS circuits. Two types of pixel detectors, one integration-type and the other counting-type, are developed and tested. We confirmed good sensitivity for light, charged particles and X-rays for these detectors. For further improvement on the performance of the pixel detector, we have introduced a new process technique called buried p-well (BPW) to suppress back gate effect. We are also developing vertical (3D) integration technology to achieve much higher density. & 2010 Elsevier B.V. All rights reserved.

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تاریخ انتشار 2011